McqMate
| Q. |
Mottling due to X ray diffraction can be identified by: |
| A. | Noting a large change between two successive exposures with the test piece rotated slightly about the beam axis |
| B. | Noting a slight change between two successive exposures with the test piece rotated slightly about the beam axis |
| C. | Noting a characteristic pattern corresponding to the lattice spacing |
| D. | None of the above |
| Answer» B. Noting a slight change between two successive exposures with the test piece rotated slightly about the beam axis | |
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