Q.

The secondary electrons radiated back in scanning microscope is collected by?

A. specimen
B. anode
C. vacuum chamber
D. cathode
Answer» B. anode
Explanation: in scanning electron microscope (sem), the surface of the specimen is irradiated with a very narrow beam of electrons. such irradiations causes low energy (secondary) electrons to be ejected from the specimen which can then be collected on a positively-charged plate or anode thereby generating an electric signal.
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