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Q. |
In this iterative test generation method, sequential logic is |
A. | used in the same pattern |
B. | converted to test logic |
C. | converted to combinational logic |
D. | converted to asynchronous logic |
Answer» C. converted to combinational logic | |
Explanation: in this iterative test generation method, the main approach of testing is sequential logic is converted into combinational logic by cutting the feedback lines, thus creating pesudo inputs and outputs. |
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