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| Q. |
In this iterative test generation method, sequential logic is |
| A. | used in the same pattern |
| B. | converted to test logic |
| C. | converted to combinational logic |
| D. | converted to asynchronous logic |
| Answer» C. converted to combinational logic | |
| Explanation: in this iterative test generation method, the main approach of testing is sequential logic is converted into combinational logic by cutting the feedback lines, thus creating pesudo inputs and outputs. | |
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