Which of the following component of TEM focuses the beam of electrons on the sample?

Related MCQs

• Which of the following techniques are used in Transmission Electron Microscopy (TEM) for examining cellular structure?
• TEM and SEM are the same microscopy techniques.
• The resolving power of TEM is derived from                                
• The resolution attainable with standard TEM is less than the theoretical value.
• During TEM, a vacuum is created inside the                                                    
• The ratio of maximum deflection of a beam to its                        is called stiffness of the beam.
• Stiffness of the beam is inversely proportional to the            of the beam.
• Calculate the radioactive minority carrier lifetime in gallium arsenide when the minority carriers are electrons injected into a p-type semiconductor region which has a hole concentration of 1018cm-3. The recombination coefficient for gallium arsenide is 7.21*10-10cm3s-1.
• The secondary electrons radiated back in scanning microscope is collected by?
• On what factors do the intensity of secondary electrons depend upon?